Optical And Structural Characterization Of Fluorine-doped Sno2 Thin Films Prepared By Spray Ultrasonic

In this work, Fluorine-doped tin dioxide (FTO) films were prepared with spray ultrasonic technique using SnCl2 and NH4F as sources of SnO2 and fluorine dopant, the films were deposited on MICROSCOPE SLIDES (REF 217102) used as glass substrates. The optical and structural properties of the films for different doping concentration (for 3-18 wt% NH4F) were studied. The optical properties of the films were studied by UV–vis spectroscopy. Optical transmittance spectra of the films showed high transparency of about 72.8–83.5% in visible region which increases with increases F-doping. The optical gap for F-doped SnO2 films was found in the range from 4.31 to 4.37 eV. The structure and topography of the ultra sonic deposited films were characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM). X-ray diffraction studies showed that the SnO2: F films were polycrystalline and have preferential orientations along (2 0 0) planes and grain sizes in the range of 14–30 nm. SEM studies reveal the same observation on the effect of the fluorine doping.